Microscopy and Thin Film Characterization for Failure Analysis

Training Provider: Republic Polytechnic
Course Reference: TGS-2021004666
S$101
Original: S$335
Save S$235

About This Course

By the end of the course, participants will be able to:
• Explain how microscopy and thin film characterization are commonly used in the semiconductor / manufacturing / coating industry
• Understand the working principles and differences of various microscopes and thin film characterization tools for an effective failure analysis
• Go through hands-on / demo session on a) various types of microscopes (such as optical microscope & SEM) to understand the relationship among magnification, resolution and depth of field for an effective imaging and b) various thin film characterization tools (such as ellipsometer & four point probe) to obtain important properties of thin film / coating.

What You'll Learn

Ever wondered how imaging and characterization tools work to gain insight into failures of devices?

Find out for yourself through this introductory course where you will be introduced to the fundamentals of microscopy and thin film characterization for failure analysis.

To facilitate your learning experience, there will be hands-on and demo sessions for participants to understand the working principles and applications of some of the microscopes and thin film characterization tools.

Entry Requirements

Nil

Course Details

Duration 8 hours
Language Not specified
Training Commitment Not specified
Total Enrolled New course
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