Measurement Techniques and Failure Analysis
About This Course
This module covers the basic principles and techniques employed in semiconductor characterization and failure analysis. Participants will learn to decide on the choice of measurement and imaging techniques, depending on the application. It covers optical microscopy, electron microscopy and fault localization.
What You'll Learn
Entry Requirements
3 GCE ‘O’ Levels passes including English (Grade 1 to 7), Science (Grade 1 to 6) and 1 relevant subject (Grade 1 to 6) with at least 3 years of relevant work experience;
NITEC or NITEC in Technology/Services (GPA 3.5 and above) with at least 2 years of relevant work experience;
Higher NITEC or Higher NITEC in Technology/Services with at least 1 year of relevant work experience;
Relevant WSQ Diploma with at least 3 years of relevant work experience.